José A. Gutierrez
Brian S.R. Armstrong

2008

Finding and Achieving
the Maximum Possible Accuracy

Precision landmark location in digital images is one of those interesting problems in which industrial practice seems to outstrip the results available in the scholarly literature. Approaching this problem, we remarked that the best-performing commercial close-range photogrammetry systems have specified accuracies of a part per 100,000, which translates to 10–20 millipixels of uncertainty in locating features for measurement.